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Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights

Eric Cheng,Jacob Abraham,Pradip Bose,Alper Buyuktosunoglu,Keith Campbell,Deming Chen,Cheng-Yong Cher,Hyungmin Cho,Binh Le,Klas Lilja,Shahrzad Mirkhani,Kevin Skadron,Mircea Stan,Lukasz Szafaryn,Christos Vezyrtzis,Subhasish Mitra

2017 IEEE International Conference on Computer Design (ICCD)（2017）

引用 5|浏览110
关键词
cross-layer resilience,soft errors,voltage noise
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