Deep Metric Learning via Facility Location

30TH IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2017)(2016)

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摘要
Learning the representation and the similarity metric in an end-to-end fashion with deep networks have demonstrated outstanding results for clustering and retrieval. However, these recent approaches still suffer from the performance degradation stemming from the local metric training procedure which is unaware of the global structure of the embedding space. We propose a global metric learning scheme for optimizing the deep metric embedding with the learnable clustering function and the clustering metric (NMI) in a novel structured prediction framework. Our experiments on CUB200-2011, Cars196, and Stanford online products datasets show state of the art performance both on the clustering and retrieval tasks measured in the NMI and Recall@K evaluation metrics.
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关键词
deep metric learning,facility location,deep networks,retrieval,metric learning scheme,structured prediction,clustering quality metric,R@K evaluation metrics,image similarity metrics learning,embedding space global structure,CUB200-2011,Cars196,Stanford online products
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