Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives

    Proceedings of the IEEE, Volume 105, Issue 9, 2017, Pages 1666-1704.

    Cited by: 72|Bibtex|Views3|Links
    EI

    Abstract:

    NAND flash memory is ubiquitous in everyday life today because its capacity has continuously increased and cost has continuously decreased over decades. This positive growth is a result of two key trends: 1) effective process technology scaling; and 2) multi-level (e.g., MLC, TLC) cell data coding. Unfortunately, the reliability of raw da...More

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