Methodology of generating dual-cell-aware tests

Yu-Hao Huang
Yu-Hao Huang
Tse-Wei Wu
Tse-Wei Wu
Yu-Teng Nien
Yu-Teng Nien
Max Wu
Max Wu
Jih-Nung Lee
Jih-Nung Lee

VTS, pp. 1-6, 2017.

Cited by: 5|Bibtex|Views4|Links
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Abstract:

This paper introduces a novel fault model, called the dual-cell-aware (DCA) fault model, which targets the short defects locating between two adjacent standard cells placed in the layout. A layout-based methodology is also presented to automatically extract valid DCA faults from targeted designs and cell libraries. The identified DCA faul...More

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