Automated Epileptic Seizure Detection in EEGs Using Increment Entropy

2017 IEEE 30TH CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING (CCECE)(2017)

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摘要
This paper presents an automated method for seizure detection in EEGs using an increment entropy (IncrEn) and support vector machines (SVMs). The IncrEn is a measure of the complexity of time series, which characterizes both the permutation of values and the temporal order of values. The IncrEn is used to extract features of epileptic EEGs and normal EEGs. The SVMs are employed to classify seizure EEGs from non-seizure ones. The maximum accuracy achieves 97.32%. The maximum sensitivity and the maximum specificity are 95.34% and 99.30%, respectively. The results indicate our approach using the IncrEn and SVMs is an effective tool to detect EEG seizure.
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关键词
automated epileptic seizure detection,EEG,increment entropy,support vector machines,SVM,time series,feature extraction,maximum sensitivity,maximum specificity,IncrEn
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