Pylon: Towards An Integrated Customizable Volume Diagnosis Infrastructure

Yan Pan,Rao Desineni,Kannan Sekar,Atul Chittora,Sherwin Fernandes,Neerja Bawaskar,John Carulli

PROCEEDINGS 2016 IEEE INTERNATIONAL TEST CONFERENCE (ITC)（2016）

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摘要

This paper describes a volume diagnosis infrastructure built on open-source software, which addresses practical challenges in a foundry environment by integrating various data sources from design, manufacturing process and test to enable rapid root-cause identification.

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关键词

Yield,systematics defects,scan diagnosis,volume diagnosis,yield analysis,design systematics

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