Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques
ASP-DAC, pp. 426-431, 2017.
This paper presents a statistical model-fitting framework to efficiently decompose the impact of device Vt variation and power-network IR drop from the measured ring-oscillator frequencies without adding any extra circuitry to the original ring oscillators. The framework applies Gaussian process regression as its core model-fitting techni...More
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