Predicting Vt variation and static IR drop of ring oscillators using model-fitting techniques

Wei-Tse Hung
Wei-Tse Hung
Wen-Hsiang Chang
Wen-Hsiang Chang
Jih-Nung Lee
Jih-Nung Lee

ASP-DAC, pp. 426-431, 2017.

Cited by: 1|Bibtex|Views1|Links
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Abstract:

This paper presents a statistical model-fitting framework to efficiently decompose the impact of device Vt variation and power-network IR drop from the measured ring-oscillator frequencies without adding any extra circuitry to the original ring oscillators. The framework applies Gaussian process regression as its core model-fitting techni...More

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