Tracking BTI and HCI Effects at Circuit-Level in Adaptive Systems
2016 14th IEEE International New Circuits and Systems Conference (NEWCAS)（2016）
Key words
HCI effects,BTI effects,adaptive systems,performance loss,in-situ delay monitors,local temperature sensors,simplified circuit-level model,FD-SOI technology,MATLAB-Simulink environment,circuit aging,maximum clock frequency reduction,bias temperature instability,hot carrier injection
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