Session 4B - Panel data analytics in semiconductor manufacturing.

Modern IC design and manufacturing have progressed in leaps and bounds, resulting in unimaginable integration, and power-performance advancements. This progress has been accompanied by adverse design-layout-process interactions and increased defect sensitivity. Controlling these complex interactions has exacted a steep price in terms of delaying yield ramp, extending silicon validation to characterize and fix marginal effects, and test screening being overwhelmed in time and volume to be able to ensure outgoing customer quality.