Introducing IC reliability elements in digital circuits and systems design education

Fabio Campi, Josh Ancill

2016 IEEE International Symposium on Circuits and Systems (ISCAS)(2016)

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摘要
With the latest advances in technology scaling, reliability of IC design has emerged as an issue of significant concern in the VLSI design community. Reliability is a global concept that needs to be challenged with a system-level approach: all disciplines in circuit and systems education are steadily introducing reliability aspects in their coursework. Still, engineers need to be educated to a holistic view that must include in one context all different aspects of a digital system (analog / digital / packaging / board / software). This work describes an attempt at increasing the coverage and efficacy of this specific learning outcome in digital design courses, introducing a new tool and a new set of lab assignments on top of “standard” digital design flows introduced in previous offerings.
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关键词
IC reliability elements,digital circuits,systems design education,technology scaling,IC design,VLSI design community,system-level approach,digital design courses
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