Comprehensive Scaling Analysis of Current Induced Switching in Magnetic Memories Based on In-Plane and Perpendicular Anisotropies.

IEEE Journal on Emerging and Selected Topics in Circuits and Systems(2016)

引用 56|浏览7
暂无评分
摘要
Spin transfer torque based magnetic memories (STT-MRAMs) are leading contender for the replacement of SRAM caches. However, STT-MRAMs suffer from high write current, read/write stability conflicts and other failure mechanisms. In this paper, we present a comprehensive scaling analysis for STT-MRAMs based on in-plane and perpendicular anisotropy magnets in context to different failure mechanisms. W...
更多
查看译文
关键词
Magnetic tunneling,Mathematical model,Anisotropic magnetoresistance,Magnetization,Critical current density (superconductivity),Switches,Market research
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要