Random pattern generation for post-silicon validation of DDR3 SDRAM

VTS, pp. 1-6, 2015.

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Abstract:

Due to the demand of pursuing a main memory with larger data bandwidth, higher data density, and lower power, the specification of DRAM has been constantly evolved in the past decade. The new DRAM specifications support multiple operating modes with multiple timing settings. It then becomes computationally infeasible to exhaustively valid...More

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