Boolean and Pseudo-Boolean Test Generation for Feedback Bridging Faults.

IEEE Transactions on Computers(2016)

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摘要
Feedback bridging faults may give rise to oscillations within integrated circuits. This work mainly investigates the propagation of oscillations, a behavior that may have a relevant impact on the fault detection. We propose both a logic-level model of the faulty circuit and two techniques aiming to the generation of high-quality test sequences.
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关键词
Oscillators,Logic gates,Integrated circuit modeling,Fault detection,Feedback loop,Electrical fault detection
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