Boolean and Pseudo-Boolean Test Generation for Feedback Bridging Faults.
IEEE Transactions on Computers(2016)
摘要
Feedback bridging faults may give rise to oscillations within integrated circuits. This work mainly investigates the propagation of oscillations, a behavior that may have a relevant impact on the fault detection. We propose both a logic-level model of the faulty circuit and two techniques aiming to the generation of high-quality test sequences.
更多查看译文
关键词
Oscillators,Logic gates,Integrated circuit modeling,Fault detection,Feedback loop,Electrical fault detection
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要