Low-Power Programmable PRPG With Test Compression Capabilities

IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2015)

引用 21|浏览90
暂无评分
摘要
This paper describes a low-power (LP) programmable generator capable of producing pseudorandom test patterns with desired toggling levels and enhanced fault coverage gradient compared with the best-to-date built-in self-test (BIST)-based pseudorandom test pattern generators. It is comprised of a linear finite state machine (a linear feedback shift register or a ring generator) driving an appropria...
更多
查看译文
关键词
Switches,Generators,Registers,Built-in self-test,Latches,Phase shifters,Logic gates
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要