Low-Power Programmable PRPG With Test Compression Capabilities
IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2015)
摘要
This paper describes a low-power (LP) programmable generator capable of producing pseudorandom test patterns with desired toggling levels and enhanced fault coverage gradient compared with the best-to-date built-in self-test (BIST)-based pseudorandom test pattern generators. It is comprised of a linear finite state machine (a linear feedback shift register or a ring generator) driving an appropria...
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关键词
Switches,Generators,Registers,Built-in self-test,Latches,Phase shifters,Logic gates
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