Ion beam induced luminescence (IBIL) system for imaging of radiation induced changes in materials

The progress of construction on the new IBIL (ion beam induced luminescence) spectrometer installed at the ion microprobe facility of the Ruđer Bošković Institute (RBI) is reported. The IBIL system can be used with beams from either 6.0MV Tandem Van de Graaff or 1.0MV Tandetron accelerators. Components of the new apparatus and current experimental set-up are described in detail. Measurements with the new IBIL system were performed using a 2MeV proton microbeam on three sets of samples. This paper gives a summary of the IBIL arrangement capabilities for various problems, emphasising the potential of this technique for radiation damage studies. Due to the relatively good sensitivity of the IBIL spectrometer, integration into the conventional ion beam analysis (IBA) microbeam setup is shown to be possible.