Development of CdTe pixel detector for synchrotron radiation experiments

This study describes the development of a CdTe pixel detector for high-energy X-ray diffraction experiments at synchrotron radiation facilities. We have developed three prototypes. The third prototype detector (SP8-02B) was designed with a pixel size of 200μm×200μm and a matrix of 20×50 pixels. The sensor was bonded to an application-specific integrated circuit with a preamplifier, shaper, window-type discriminator, and a 20-bit counter for each pixel. The SP8-02B detector improved the uniformity between pixels in one chip in comparison with the previous prototypes. The long-term stability was measured at various temperatures. A moderate cooling achieved good stability that was not affected by the polarization effect.