Vortex Dynamics in Thin4He Films

D. F. McQueeney, G. Agnolet, G. K. S. Wong, J. D. Reppy

Japanese Journal of Applied Physics(1987)

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摘要
Measurements of the Kosterlitz-Thouless transition in thin 4He films on a mylar substrate show a striking dependence on film thickness. We have studied films with transition temperatures (TKT) ranging from 67mK to 1.3K. Most of the transitions are too broad to fit the dynamic theory of Ambegaokar, Halperin, Nelson and Siggia. We observe four narrow regions of sharp transitions with TKT near .115, .550, 1.0 and 1.3 K.
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