Characterization of traps in SiC/SiOTetsuo Hatakeyama,Mitsuru Sometani,Kenji Fukuda,Hajime Okumura,Tsunenobu KimotoJapanese Journal of Applied Physics(2015)引用 23|浏览6暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要