On Aging-Aware Signoff for Circuits With Adaptive Voltage Scaling
IEEE Transactions on Circuits and Systems I: Regular Papers(2014)
摘要
Transistor aging due to bias temperature instability (BTI) is a major reliability concern in sub-32 nm technology. To compensate for aging, designs now typically apply adaptive voltage scaling (AVS) to mitigate performance degradation by elevating supply voltage. Since varying the supply voltage also causes the BTI degradation to vary over lifetime, this presents a new challenge for margin reducti...
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关键词
Libraries,Degradation,Delays,Aging,Integrated circuit modeling,Transistors
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