ESD design automation & methodology to prevent CDM failures in 130 & 90 nm ASIC design systems

robert proctor
robert proctor
james sundquist
james sundquist
terry lowe
terry lowe

Journal of Electrostatics, 2006.

Cited by: 7|Bibtex|Views15|Links
Keywords:
design automationfailure modecdmchipdesign rule checking

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