Supply Voltage Dependency on the Single Event Upset Susceptibility of Temporal Dual-Feedback Flip-Flops in a 90 Nm Bulk CMOS Process
IEEE Transactions on Nuclear Science（2015）
Key words
Complimentary metal-oxide semiconductor (CMOS),flip-flop,low power,low voltage,radiation tolerant,single event transient (SET),single event upset (SEU)
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