Application of polycapillary X-ray optics in residual stress measurement

A polycapillary X-ray optics is developed and used in a micro-area XRD residual stress measurement. The results are compared with the traditional pinhole method. Both diffraction intensity and peak height obtained from the application of this polycapillary are enhanced by dozens of times than that from the pinhole method. The experimental results exhibit the advantage of this polycapillary optics in the micro-area residual stress measurement with higher detectable signal and more accuracy.