Interference lithography at EUV and soft X-ray wavelengths: Principles, methods, and applications
Microelectronic Engineering(2015)
摘要
•A review on interference lithography at EUV and soft X-ray wavelengths.•Achievements of groups in the field and their tool specifications and capabilities.•Description of XIL-II synchrotron beamline and the tabletop system at RWTH Aachen.•Applications are high-resolution patterning with EUV and Beyond EUV light.•Applications in Talbot lithography, tall nanostructure fabrication, and sensing.
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关键词
EUV lithography,Soft X-ray lithography,Technology node,Silicon nanowires,Nanofabrication,Synchrotron beamline
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