Positron Annihilation Study Of Defects In Electron-Irradiated Single Crystal Zinc Oxide
12TH INTERNATIONAL WORKSHOP ON SLOW POSITRON BEAM TECHNIQUES (SLOPOS12)(2011)
摘要
Pressurized melt grown zinc oxide (ZnO) single crystals purchased from Cermet Inc. were irradiated by 2MeV electrons with fluence of 6x10(17) cm(-2). Isochronal annealing from 100 degrees C-800 degrees C was performed on the crystals under argon and air ambience. Variable Energy Doppler Broadening Spectroscopy (VEDBS) was carried out on both the as-grown and the irradiated samples at each annealing step. The migration, agglomeration and annealing of grown-in and irradiated-introduced defects were studied. It was observed that the grown-in vacancy-type defects concentration decreased at 300 degrees C and 600 degrees C. For the irradiated sample annealed in argon, the positron trapping vacancy-type defect concentration decreased at 300 degrees C and 600 degrees C. Further annealing the as-grown and irradiated samples in argon increased the S parameter further. For the irradiated sample annealed in air, the vacancy-type defect concentration decreases at 300 degrees C and 700 degrees C.
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关键词
zinc oxide,electron irradiation,single crystal
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