Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
C. Trager-Cowan,G. Naresh-Kumar, N. Allehiani,S. Kraeusel,B. Hourahine,S. Vespucci,D. Thomson,J. Bruckbauer,G. Kusch,P. R. Edwards,R. W. Martin,C. Mauder,A. P. Day,A. Winkelmann,A. Vilalta-Clemente,A. J. Wilkinson,P. J. Parbrook,M. J. Kappers,M. A. Moram,R. A. Oliver,C. J. Humphreys,P. Shields,E. D. Le Boulbar,D. Maneuski,V. O'Shea,K. P. Mingard Microscopy and Microanalysis（2014）
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