Recovery of Bipolar-Current Induced Degradations in High-Voltage Implanted-Gate Junction Field Effect Transistors
Materials science forum（2012）
Key words
JFET,stacking faults,bipolar degradation,silicon carbide,stressing,annealing,stacking fault shrinking
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined