Investigation of Defects in Solar Cells and Wafers by Means of Magnetic Measurements
Diffusion and defect data, solid state data Part B, Solid state phenomena/Solid state phenomena（2011）
Key words
shunt,grain boundary,electrical losses,defects,current,current distribution,current loss,magnetic field distribution,multicrystalline silicon,magnetic measurement
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined