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Gaia On-Board Metrology: Basic Angle and Best Focus

A. Mora,M. Biermann,A. G. A. Brown,D. Busonero,L. Carminati,J. M. Carrasco,F. Chassat,M. Erdmann,W. L. M. Gielesen,C. Jordi,D. Katz,R. Kohley,L. Lindegren,W. Loeffler,O. Marchal,P. Panuzzo,G. Seabroke,J. Sahlmann,E. Serpell,I. Serraller,F. van Leeuwen,W. van Reeven,T. C. van den Dool,L. L. A. Vosteen

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE（2014）

Cited 12|Views26
Key words
Astrometry,Gaia,metrology,interferometry,basic angle monitor,wavefront sensor,Shack-Hartmann,wavefront reconstruction,centroid,Cramer-Rao,spectral resolution
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