Method and system to optimize test cost and disable defects for scan and BIST memoriesLaungterng Wang,Shyhhorng Lin, Chichan Hsu,Xiaoqing Wen, Anthony M Vu,Yo Han Park,Hsinpo Wangmag(2002)引用 59|浏览6暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要