Power And Noise Aware Test Using Preliminary Estimation

Issues oil power consumption and IR-drop in testing become serious problems. Some troubles, such as tester fails clue to too much power consumption or IR-drop, test escapes due to slowed clock cycle, and so oil, can happen in test floors. In this paper, we propose a power and noise aware scan test method. In the method, power-aware DFT and power-aware ATPG are executed based on the preliminary power/noise estimation for test. Experimental results illustrate the effect of reducing IR-drop for both shift and capture mode in scan test.