Chemical-Mechanical Polishing Of Bulk Tungsten Substrate

2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)(2013)

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摘要
Bulk tungsten is very promising for packaging and micro-devices for its high strength, radiation resistance, high melting point and conductivity. In this paper, chemical mechanical polishing of bulk tungsten substrate was carried out. A 4 inch tungsten wafer was polished at the optimized condition with an average surface roughness of 4.63nm achieved. Bulk tungsten applications in packaging and micro-devices will be expanded.
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关键词
CMP,tungsten,average surface roughness,the platen rotational speed
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