EVALUATION OF PERFORMANCE, RELIABILITY, AND RISK FOR HIGH PEAK POWER RF SOURCES FROM S-BAND THROUGH X-BAND FOR ADVANCED ACCELERATOR APPLICATIONS * Maria Fazio,C Adolphsen,Anja T R Jensen,Charles Pearson,D Sprehn,A E Vlieks, Fei Wangmag(2011)引用 23|浏览2AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要