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排名必读论文期刊顶会热点AI 简史溯源树小脉星探人才迁徙塔尖人才国防情报追踪开源工具智慧手语
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OPPORTUNISTIC PLACEMENT OF IC TEST STRUCUTRES AND/OR E-BEAM TARGET PADS IN AREAS OTHERWISE USED FOR FILLER CELLS, TAP CELLS, DECAP CELLS, SCRIBE LINES, AND/OR DUMMY FILL, AS WELL AS PRODUCT IC CHIPS CONTAINING SAME

Indranil De,Dennis Ciplickas,Stephen Lam, Jonathan Haigh,Vyacheslav Rovner, Christopher P Hess, Tomasz W Brozek,Andrzej J Strojwas,Kelvin Yihyuh Doong,John K Kibarian,Sherry F Lee, Kimon Michaels, Marcin A Strojwas, Conor Osullivan, Mehul Jain

mag（2015）

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