Heavy Ion Current Transients in SiGe HBTs
Jonathan A Pellish,R A Reed,G Vizkelethy,Dale Mcmorrow,V Ferletcavrois,J Baggio, Philipe Paillet, Olivier Duhanel,S D Phillips,A K Sutton,R M Diestelhorst,John D Cressler,P E Dodd,M L Alles,R D Schrimpf,P W Marshall,Kenneth A Label mag(2009)
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fabrication,bias,simulation
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