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Gate dielectric breakdown protection during ESD events

michel j aboukhalil
michel j aboukhalil
[0]
james p di sarro
james p di sarro
robert j gauthier
robert j gauthier
[0]
junjun li
junjun li
[0]
souvick mitra
souvick mitra
[0]
yang yang
yang yang
[0]

2014.

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