The effect of power islands on delta-I noise, interconnect noise, and timing for wide, on-chip data-buses

Alina Deutsch,H H Smith, H M Huang, A Elfadel

ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING(2005)

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摘要
A study is shown of the effect of having breaks in the power distribution on large microprocessor chips. The effect on delta-I noise, interconnect noise, and timing is illustrated through simulation results obtained with representative driver and receiver circuits and guidelines are given on how to minimize the impact of the power islands.
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