Establishing Traceability to the International System of Units for Scattering Parameter Measurements from 750 GHz to 1.1 THz
IEEE Transactions on Terahertz Science and Technology（2016）
摘要
In this paper, we describe a new measurement capability which provides fully calibrated, traceable scattering parameter measurements in rectangular metallic waveguide in the frequency range 750 GHz-1.1 THz. The instrumentation consists of a vector network analyzer (VNA) with waveguide extender heads, situated at the University of Leeds, Leeds, U.K., and primary measurement standards characterized ...
更多查看译文
关键词
Standards,Calibration,Frequency measurement,Optical waveguides,Apertures,Transmission line measurements,Measurement uncertainty
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要