ESD simulation with Wunsch-Bell based behavior modeling methodology
electrical overstress electrostatic discharge symposium(2011)
摘要
Conventional modeling methods for ESD protection can be specific to device types or cannot reproduce the self-heating effect. This work proposes a straightforward modeling methodology based on the Wunsch-Bell characterization method using TLP. It allows precise ESD simulation verified by measurements.
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关键词
integrated circuit,fitting,behavior modeling,data model,data models,electrostatic discharge
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