Estimation Of Power Integrity Impact To Low Power Processor Performance Through Pre-Silicon Simulation And Post-Silicon Measurements

PROCEEDINGS OF THE ASME PACIFIC RIM TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC SYSTEMS, MEMS AND NEMS 2011, VOL 1(2012)

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摘要
The impact of power integrity on processor performance is critical in nano-scale era. We proposed the enhanced pre-silicon simulation to accurately capture the power delivery quality. The post silicon performance measurements correlates well with pre-silicon analysis and demonstrate that power integrity could impact performance up to 15% in low and high frequencies.
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关键词
simulation,silicon,measurement
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