Estimation Of Power Integrity Impact To Low Power Processor Performance Through Pre-Silicon Simulation And Post-Silicon Measurements
PROCEEDINGS OF THE ASME PACIFIC RIM TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC SYSTEMS, MEMS AND NEMS 2011, VOL 1(2012)
摘要
The impact of power integrity on processor performance is critical in nano-scale era. We proposed the enhanced pre-silicon simulation to accurately capture the power delivery quality. The post silicon performance measurements correlates well with pre-silicon analysis and demonstrate that power integrity could impact performance up to 15% in low and high frequencies.
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关键词
simulation,silicon,measurement
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