Dependence of the Multi-Component Nature of Bias Temperature Instability in Mosfets on Oxide and Device Type
DIELECTRICS FOR NANOSYSTEMS 6 MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING（2014）
关键词
NBTI Degradation,Metal Gate Transistors,Double-Gate Transistors,Tunnel Field-Effect Transistors,CMOS Scaling
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