Nanometer-Scale Surface Element Analysis Using Laser Ablation Atomic Fluorescence Spectroscopy

Takashi Higotani,M K Kim, Takeshi Takao,Yuji Oki, M Maeda

CLEO(R)/PACIFIC RIM 2001, VOL I, TECHNICAL DIGEST(2001)

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摘要
Using the ultraviolet laser ablation, a very thin layer removal of a polymer and a glass was possible by single laser shot. Element analysis with nanometer-scale resolution was demonstrated for polymethyl methacrylate sample in combination with the laser-induced fluorescence spectroscopy. Nanometer-scale removal was also possible for silicon and metals by femtosecond laser ablation.
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关键词
fluorescence spectroscopy,fluorescence,laser induced fluorescence,spectroscopy
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