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排名必读论文期刊顶会热点AI 简史溯源树小脉星探人才迁徙塔尖人才国防情报追踪开源工具智慧手语
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Measurements of 3D Silicon Strip Sensors by two Manufacturers

Matthew J Koehler,Siegfried Eckert,Kai Jakobs,Susanne Kuehn, G Pahn, U Parzefall,C Fleta,Giulio Pellegrini,Manuel Lozano,G F Dalla Betta,Andrea Zoboli,M Boscardin, S Ronchin,N Zorzi, J Haerkoenen,Panjariina Luukka, T Maeenpaeae, H Moilanen,Rebecca Bates, Samuel H Houston, C Parkes

Proceedings of 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors — PoS(RD09)（2009）

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