Scanning White Light Interferometry for Optical Scanner Calibration using GEM-foil based Traceable Standard

Frontiers in Optics(2014)

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摘要
Gas Electron Multiplier (GEM) detectors record particle trajectories in colliders. GEM characterization is important during manufacturing and final testing. We established a traceable method to calibrate our Optical Scanning System employed for quality control of GEM foils.
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