Physical Properties of HWCVD Microcrystalline Silicon Thin Films: Preprint

H R Moutinho,Manuel Romero,C S Jiang,Y Xu,Brent P Nelson,K M Jones,A H Mahan,M M Aljassim

mag（2002）

引用 23|浏览6

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atomic force microscopy,dilution,materials science,raman spectroscopy,microstructure,solar energy,material properties,thin film,x ray diffraction,crystallization,thin films,microstructures,scanning electron microscopy,hydrogen,silicon,physical properties,texture,morphology

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