Conformal doping of 3-D structures using sub-atmospheric CVD films
2010 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE(2010)
摘要
Applicability of SACVD for doping of 3-D structures was assessed on both flat substrates as well as patterned structures focusing on the optimization of dopant profile within the SACVD film. Boron and phosphorous doped ultra-shallow junctions of 6 and 10nm respectively are obtained with surface concentration in excess of 1E21 at/cc for this intrinsically conformal and damage-free technique
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关键词
silicon,process control,semiconductor doping,chemical vapour deposition,doping,annealing,boron,films,phosphorus
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