P10.1 Investigation of Channel Backscattering Characteristics for Nanoscale SOI MOSFETs Using a New Temperature-Dependent Method
Oussama Moutanabbir,Manfred Reiche,W Erfurth, Roland Scholz, Ulrich Gosele, Wing Lee,Pin Su, Ammar Nayfeh,Victor Koldyaev,P Beaud,Mikhail Nagoga,Serguei Okhonin,Innovative Silicon,Soi Cmos,Daniel Gloria,S Boret, O Bon, P Touret,Carine Pastore, B Rauber, C Raynaud,Cea Leti, Ning Fang, Z Yang, Anyeu Wu, Jiajia Chen, Mingwen Zhang, Shan Zou, Ximo Wang, Xu Wei, Bing Zhang, Mingshui Chen, C Lin mag（2008）
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