Digital Integrated Circuit Design: Physical Design
mag（2008）
关键词
schottky junction,zener diode,gate oxide,sram,body,current density,latch up,ringing,leakage current,nanocircuits,probe card,pn junction,sheet resistance,flip chip,processing,bypass capacitor,doping,layout design,testing,thyristor,fuse,macro,process,turnaround time,depletion region,interconnect,electromigration,guard,cell,process variation,gate,ground bounce,operating temperature,yield,emitter,diode,fowler nordheim tunneling,floorplan,package,gate dielectric,sorting,electronic,optoelectronic devices,threshold voltage,capacitor,carrier mobility,crosstalk,standard cell,aspect ratio,encapsulation,heat spreader,lateral diffusion,radiation,core,dopant,floorplanning,lithography,wire bonding,bjt,photomask,salicide,wafer,source
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要