70nm DRAM Intra-field CDU Improvement by Dose Modulation on Mask Transmittance
Proceedings of SPIE, the International Society for Optical Engineering(2008)
摘要
DRAM intra-field CD uniformity (CDU) demand becomes more crucial with pattern size shrink and wafer die or
memory size expanding. Intra-field CDU error mainly comes from mask CD error, scanner exposure and wafer process.
This study makes use of a method to extract systematic CDU error from multi-field CDU results. Based on the
information of the systematic CDU error, localized mask transmittance modulation is implemented to compensate the
intra-field systematic CDU error on wafer. A focused ultrafast laser beam forms shading elements in mask quartz
substrate. Mask transmittance modulation is controlled by the shading element density variation. This study will
demonstrate the intra-field CDU improvement result, CD modulation calibration validity, CD proximity variation result
and mask inspection result etc.
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关键词
data storage,transmittance,calibration,lasers,modulation,inspection
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