Switch branch in trap-rich RFSOI with 84 dBm off-state IP3

Thomas Mckay, P R Verma,Shaoqiang Zhang,Jen Shuang Wong, James Brunner

2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)(2015)

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摘要
Third-order intermodulation intercept (IP3) of 90 dBm required for uplink carrier aggregation in LTE systems drives technology, modeling, design and characterization methods for Front-End semiconductor technology. For the first time, direct on-wafer switch branch IP3 of 84 dBm on trap-rich RF silicon on insulator (RFSOI) is demonstrated. Exploiting widely available low passive intermodulation (PIM) techniques, intermodulation distortion of switch branches and transmission lines is easily obtained to 10 Watts RF input power. On-wafer measurement system IP3 of 98 dBm gives visibility beyond harmonic distortion to the critical product level requirement of IP3.
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关键词
intermodulation distortion,high-resistivity silicon,RF switch,silicon-on-insulator,carrier aggregation,on-wafer probing,passive intermodulation
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