MEASUREMENTS OF SECONDARY ELECTRON YIELD OF METAL SURFACES AND FILMS WITH EXPOSURE TO A REALISTIC ACCELERATOR ENVIRONMENT ∗ W Hartung, J Conway,C A Dennett, Shlomo Greenwald, Ying Li,T B Moore, V Omanovicmag（2013）引用 25|浏览13暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
